DocumentCode :
1195653
Title :
A theoretical and experimental study of the noise behavior of subharmonically injection locked local oscillators
Author :
Zhang, Xiangdong ; Zhou, Xuesong ; Daryoush, Afshin S.
Author_Institution :
Dept. of Electr. & Comput. Eng., Drexel Univ., Philadelphia, PA, USA
Volume :
40
Issue :
5
fYear :
1992
fDate :
5/1/1992 12:00:00 AM
Firstpage :
895
Lastpage :
902
Abstract :
A method for the phase-noise characterization of optically controlled subharmonically injection-locked oscillators that is based on a nonlinear model of synchronized oscillators is presented. It allows FM noise degradation at large-signal levels to be predicted easily and accurately. The theoretical analysis shows that (1) the nth-order subharmonic injection locking oscillator is primarily locked by the nth harmonic output of an injected signal, which is generated by the nonlinearity of the active device; (2) the minimum FM noise degradation factor of the nth-order subharmonically locked oscillator is n2 when the injection power is sufficiently strong; and (3) a subharmonic injection locking LO with low injection power, good FM noise degradation, and large locking range can be designed by determining the optimum injection power level, by selecting the optimal nonlinear multiplication factor, and by decreasing the intrinsic noise level of the active device. The experimental results confirm the accuracy of the analysis
Keywords :
electron device noise; frequency modulation; microwave oscillators; nonlinear network analysis; synchronisation; FM noise degradation; LO; active device nonlinearity; large-signal levels; local oscillators; noise behavior; nonlinear model; phase-noise characterization; subharmonically injection-locked oscillators; Active noise reduction; Degradation; Harmonic analysis; Injection-locked oscillators; Noise generators; Noise level; Nonlinear optics; Optical control; Optical noise; Signal analysis;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/22.137395
Filename :
137395
Link To Document :
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