DocumentCode :
1195694
Title :
Conversion of Immittance Parameters to DC Voltages
Author :
Orsini, L.Q.
Volume :
22
Issue :
2
fYear :
1973
fDate :
6/1/1973 12:00:00 AM
Firstpage :
196
Lastpage :
198
Abstract :
Sigdell´s method of capacitance measurement [1] is generalized to the measurement of admittance and impedances. The generalized method is applied to the digital measurement of inductors and capacitors. The accuracy attainable in the measurement of a perfect capacitor is discussed, and it is shown that this accuracy compares favorably with the accuracy of commercial impedance bridges.
Keywords :
Admittance; Capacitance measurement; Capacitors; Circuits; Extraterrestrial measurements; Impedance measurement; Inductors; Operational amplifiers; Radio astronomy; Voltage;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/TIM.1973.4314142
Filename :
4314142
Link To Document :
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