DocumentCode
1195694
Title
Conversion of Immittance Parameters to DC Voltages
Author
Orsini, L.Q.
Volume
22
Issue
2
fYear
1973
fDate
6/1/1973 12:00:00 AM
Firstpage
196
Lastpage
198
Abstract
Sigdell´s method of capacitance measurement [1] is generalized to the measurement of admittance and impedances. The generalized method is applied to the digital measurement of inductors and capacitors. The accuracy attainable in the measurement of a perfect capacitor is discussed, and it is shown that this accuracy compares favorably with the accuracy of commercial impedance bridges.
Keywords
Admittance; Capacitance measurement; Capacitors; Circuits; Extraterrestrial measurements; Impedance measurement; Inductors; Operational amplifiers; Radio astronomy; Voltage;
fLanguage
English
Journal_Title
Instrumentation and Measurement, IEEE Transactions on
Publisher
ieee
ISSN
0018-9456
Type
jour
DOI
10.1109/TIM.1973.4314142
Filename
4314142
Link To Document