DocumentCode
1196022
Title
A Millimeter Wave Complex Reflection Coeficient Scanner
Author
Gottfried, Samuel
Volume
22
Issue
4
fYear
1973
Firstpage
325
Lastpage
330
Abstract
A broadband microwave measurement system has been designed to make complex reflection coefficient measurements on a swept basis at millineter wave frequencies. This instrument covers a frequency range of 50-75 GHz in WR-15 rectangular waveguide. Two appliques are being added in WR-22 and WR-10 waveguide to extend the frequency range of the system to 33-110 GHz. Measurements can be made while sweeping over bands as wide as 10 GHz. An interesting feature of the complex reflection coefficient scanner is that residuals, or baseline, of the system are automatically subtracted. The resultant output display is a real-time polar plot of the actual reflection coefficient of the network under test. Residuals of 0.03 for reflection coefficients around unity, and 0.013 for reflection coefficients around zero can be measured with a resolution of 0.01 while sweeping over a 5 GHz band. A maximum reflection coefficient range of 46 dB has been achieved using straightforward video detection techniques. For measurements of networks with very low reflection coefficients (0.01 and lower) a time averaging feature is available to reduce the effects of random noise. The complex reflection coefficient of the unknown can be displayed on an oscilioscope and photographed, or read out on an X-Y plotter.
Keywords
Acoustic reflection; Displays; Frequency measurement; Instruments; Microwave measurements; Millimeter wave measurements; Millimeter wave technology; Noise measurement; Rectangular waveguides; Testing;
fLanguage
English
Journal_Title
Instrumentation and Measurement, IEEE Transactions on
Publisher
ieee
ISSN
0018-9456
Type
jour
DOI
10.1109/TIM.1973.4314182
Filename
4314182
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