DocumentCode :
1196033
Title :
An asymptotically optimal detector for Gaussianity testing
Author :
Sigut, José ; Demetrio, José ; Moreno, Lorenzo ; Estévez, José ; Aguilar, Rosa ; Alayón, Silvia
Author_Institution :
Dept. of Phys., Univ. of La Laguna, Tenerife, Spain
Volume :
53
Issue :
11
fYear :
2005
Firstpage :
4186
Lastpage :
4193
Abstract :
The aim of this paper is to provide a novel approach to the classical problem of testing the Gaussianity of a stationary process where the data can be assumed to be independent and identically distributed. Some results of Large Deviations theory are used to select a set of asymptotically optimal test statistics so that their combination results in a suitable detection procedure. The Johnson system of distributions has been used as the basis for the design of the detector. The fact that the good asymptotical properties can be extended to finite samples with small sizes provides the motivation for the rest of the work. In this respect, the performance of the proposed procedure is also compared with that of some known Gaussianity tests. The possibility to directly calculate a reliable measure of support such as the Bayesian posterior probabilities, as opposed to P-values, is an additional advantage. Furthermore, it will be shown how the proposed procedure can provide some extra information concerning the type of deviation from Gaussianity, which is present in the data.
Keywords :
Gaussian distribution; signal classification; signal detection; Bayesian posterior probability; Gaussianity testing; Johnson system; asymptotically optimal detector; classification theory; large deviations theory; Bayesian methods; Detectors; Gaussian distribution; Gaussian processes; Performance analysis; Probability; Radar detection; Statistical analysis; Statistical distributions; Testing; Classification theory and applications; detection theory and applications; statistical performance analysis and error bounds;
fLanguage :
English
Journal_Title :
Signal Processing, IEEE Transactions on
Publisher :
ieee
ISSN :
1053-587X
Type :
jour
DOI :
10.1109/TSP.2005.857042
Filename :
1519686
Link To Document :
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