DocumentCode :
1196330
Title :
Harmonical characterization of a microstrip bend via the finite difference time domain method
Author :
Feix, Noel ; Lalande, Michde ; Jecko, Bernard
Author_Institution :
Inst. de Recherche en Commun. Optiques et Microondes, Limoges Univ., France
Volume :
40
Issue :
5
fYear :
1992
fDate :
5/1/1992 12:00:00 AM
Firstpage :
955
Lastpage :
961
Abstract :
A 90° microstrip bend is characterized using a time-frequency method based on the finite-difference-time-domain (FDTD) method. Time evolution of the currents generated by FDTD are Fourier transformed to lead to S-parameters and the radiated powers characteristic of the microstrip bend. The method for calculating both radiation and surface wave losses is developed for microstrip structures. The results of the 90° microstrip bend are compared with the results of the mitered microstrip bend
Keywords :
S-parameters; difference equations; losses; strip line components; time-domain analysis; 90 degree bend; FDTD; S-parameters; finite difference time domain method; harmonical characterisation; microstrip bend; radiated powers characteristic; radiation loss; surface wave losses; time-frequency method; Degradation; Finite difference methods; Integrated circuit interconnections; Integrated circuit modeling; Microstrip components; Signal analysis; Strips; Surface waves; Time domain analysis; Time frequency analysis;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/22.137403
Filename :
137403
Link To Document :
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