Harmonical characterization of a microstrip bend via the finite difference time domain method

Author

Feix, Noel ; Lalande, Michde ; Jecko, Bernard

Author_Institution

Inst. de Recherche en Commun. Optiques et Microondes, Limoges Univ., France

Volume

40

Issue

5

fYear

1992

fDate

5/1/1992 12:00:00 AM

Firstpage

955

Lastpage

961

Abstract

A 90° microstrip bend is characterized using a time-frequency method based on the finite-difference-time-domain (FDTD) method. Time evolution of the currents generated by FDTD are Fourier transformed to lead to S-parameters and the radiated powers characteristic of the microstrip bend. The method for calculating both radiation and surface wave losses is developed for microstrip structures. The results of the 90° microstrip bend are compared with the results of the mitered microstrip bend

Keywords

S-parameters; difference equations; losses; strip line components; time-domain analysis; 90 degree bend; FDTD; S-parameters; finite difference time domain method; harmonical characterisation; microstrip bend; radiated powers characteristic; radiation loss; surface wave losses; time-frequency method; Degradation; Finite difference methods; Integrated circuit interconnections; Integrated circuit modeling; Microstrip components; Signal analysis; Strips; Surface waves; Time domain analysis; Time frequency analysis;

fLanguage

English

Journal_Title

Microwave Theory and Techniques, IEEE Transactions on

Publisher

ieee

ISSN

0018-9480

Type

jour

DOI

10.1109/22.137403

Filename

137403