Title :
Data mining driven visual pattern discovery: RBEI-IYER-MC2
Author :
Singhal, Manik ; Lekkala, Prakash ; Shivashankar, M R ; Iyer, Parameshwaran S
Author_Institution :
Gl/PJ-DM, Robert Bosch Engineering & Business Solutions Ltd, Bangalore, India
Abstract :
In the following work we present a short description of data mining methods & techniques we apply to create a visual framework for VAST Mini Challenge 2 (VAST-MC2). We provide a brief description of the problem, followed by our approach to arriving on a visual framework. From our framework, post visual mining for patterns; we list some of our key findings.
Keywords :
Event-Information Framework Ripley-L factor; Markov Cluster Algorithm; Spatial Temporal clustering;
Conference_Titel :
Visual Analytics Science and Technology (VAST), 2014 IEEE Conference on
Conference_Location :
Paris, France
DOI :
10.1109/VAST.2014.7042566