A New Three-Parameter Extension to the Birnbaum-Saunders Distribution

Author

Owen, William J.

Author_Institution

Dept. of Math. & Comput. Sci., Univ. of Richmond, VA

Volume

55

Issue

3

fYear

2006

Firstpage

475

Lastpage

479

Abstract

The Binrbaum-Saunders (B-S) distribution was derived in 1969 as a lifetime model for a specimen subjected to cyclic patterns of stresses and strains, and the ultimate failure of the specimen is assumed to be due to the growth of a dominant crack in the material. The derivation of this model will be revisited, and because the assumption of independence of crack extensions from cycle to cycle can be quite unrealistic, one new model will be derived by relaxing this independence assumption. Here, the sequence of crack extensions is modeled as a long memory process, and characteristics of this development introduces a new third parameter. The model is investigated in detail, and interestingly the original B-S distribution is included as a special case. Inference procedures are also discussed, and an example dataset is used for model comparison

Keywords

Gaussian distribution; Gaussian processes; cracks; failure (mechanical); maximum likelihood estimation; stress-strain relations; Birnbaum-Saunders distribution; Gaussian process; datasets; fatigue; inference procedure; lifetime model; material crack; maximum likelihood estimation; memory process; specimen failure; stress-strain pattern; three-parameter extension; Capacitive sensors; Fatigue; Gaussian processes; Hazards; Least squares methods; Mathematics; Maximum likelihood estimation; Random variables; Shape; Stress; Cycles to failure; Gaussian process; fatigue; long-memory process; maximum likelihood estimation;

fLanguage

English

Journal_Title

Reliability, IEEE Transactions on

Publisher

ieee

ISSN

0018-9529

Type

jour

DOI

10.1109/TR.2006.879646

Filename

1688083