DocumentCode
1196442
Title
A New Method to Measure the Figure-of-Merit of Microwave Detector Diodes
Author
Cohn-Sfetcu, S. ; Buckmaster, H.A.
Volume
23
Issue
1
fYear
1974
fDate
3/1/1974 12:00:00 AM
Firstpage
102
Lastpage
103
Abstract
It is shown that the figure-of-merit of microwave detector diodes can be measured directly using a noise measurement technique based on digital Fourier analysis. This technique enables the operating conditions of these diodes to be optimized while an in situ part of an instrumentation system.
Keywords
Breakdown voltage; Detectors; Diodes; Frequency conversion; Frequency measurement; Instruments; Microwave measurements; Microwave theory and techniques; Noise measurement; Signal to noise ratio;
fLanguage
English
Journal_Title
Instrumentation and Measurement, IEEE Transactions on
Publisher
ieee
ISSN
0018-9456
Type
jour
DOI
10.1109/TIM.1974.4314229
Filename
4314229
Link To Document