Title :
A New Method to Measure the Figure-of-Merit of Microwave Detector Diodes
Author :
Cohn-Sfetcu, S. ; Buckmaster, H.A.
fDate :
3/1/1974 12:00:00 AM
Abstract :
It is shown that the figure-of-merit of microwave detector diodes can be measured directly using a noise measurement technique based on digital Fourier analysis. This technique enables the operating conditions of these diodes to be optimized while an in situ part of an instrumentation system.
Keywords :
Breakdown voltage; Detectors; Diodes; Frequency conversion; Frequency measurement; Instruments; Microwave measurements; Microwave theory and techniques; Noise measurement; Signal to noise ratio;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
DOI :
10.1109/TIM.1974.4314229
