• DocumentCode
    1196498
  • Title

    antenna-pattern correction for near-field-to-far field RCS transformation of 1D linear SAR measurements

  • Author

    LaHaie, Ivan J. ; Rice, Scott A.

  • Author_Institution
    General Dynamics Adv. Inf. Syst., USA
  • Volume
    46
  • Issue
    4
  • fYear
    2004
  • Firstpage
    177
  • Lastpage
    183
  • Abstract
    In a previous AMTA paper (B. E. Fischer, et al.), we presented a first-principles algorithm, called wavenumber migration (WM), for estimating a target´s far-field RCS and/or far-field images from extreme near-field linear (one-dimensional) or planar (two-dimensional) SAR measurements, such as those collected for flight-line diagnostics of aircraft signatures. However, the algorithm assumes the radar antenna has a uniform, isotropic pattern for both transmitting and receiving. In this paper, we describe a modification to the (one-dimensional) linear SAR wavenumber migration algorithm that compensates for nonuniform antenna-pattern effects. We also introduce two variants to the algorithm that eliminate certain computational steps and lead to more efficient implementations. The effectiveness of the pattern compensation is demonstrated for all three versions of the algorithm in both the RCS and the image domains using simulated data from arrays of simple point scatterers.
  • Keywords
    antenna radiation patterns; radar antennas; radar cross-sections; scattering; synthetic aperture radar; 1D linear SAR measurement; aircraft signature; antenna-pattern correction; far-field images; flight-line diagnostic; isotropic pattern; near-field-to-far field RCS transformation; nonuniform antenna-pattern effect; radar antenna; radar cross-sections; synthetic aperture radar; wavenumber migration; Antenna measurements; Antennas and propagation; Computational modeling; Feedback; Radar antennas; Radar cross section; Radar imaging; Radar scattering; Rails; Writing;
  • fLanguage
    English
  • Journal_Title
    Antennas and Propagation Magazine, IEEE
  • Publisher
    ieee
  • ISSN
    1045-9243
  • Type

    jour

  • DOI
    10.1109/MAP.2004.1374048
  • Filename
    1374048