• DocumentCode
    1196511
  • Title

    Parameter Estimation and Performance of the p -Chart for Attributes Data

  • Author

    Chakraborti, S. ; Human, S.W.

  • Author_Institution
    Dept. of Inf. Syst., Stat. & Manage. Sci., Alabama Univ., Tuscaloosa, AL
  • Volume
    55
  • Issue
    3
  • fYear
    2006
  • Firstpage
    559
  • Lastpage
    566
  • Abstract
    Effects of parameter estimation are examined for the well-known p-chart for the fraction nonconforming based on attributes (binary) data. The exact run-length distribution of the chart is obtained for Phase II applications, when the fraction of nonconforming items, p, is unknown, by conditioning on the observed number of nonconformities in a set of reference data (from Phase I) used to estimate p. Numerical illustrations show that the actual performance of the chart can be substantially different from what one would nominally expect, in terms of the false alarm rate and/or the in-control average run-length. Moreover, the performance of the p-chart can be highly degraded in that an exceedingly large number of false alarms are observed, particularly when p is estimated, unless the number of reference observations is substantially large, much larger than what might be commonly used in practice. These results are useful in the study of the reliability of products or systems that involve binary data
  • Keywords
    binomial distribution; control charts; parameter estimation; reliability theory; Shewhart chart; attributes data; binomial distribution; control chart; false alarm rate; fraction nonconforming; p-chart performance; parameter estimation; product reliability; run-length distribution; Control charts; Equations; Parameter estimation; Probability distribution; Production; Random variables; Signal processing; Average run-length; Shewhart chart; binomial distribution; fraction nonconforming; in-control; out-of-control; parameter estimation; percentiles; phase I & II; run-length distribution;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/TR.2006.879662
  • Filename
    1688093