DocumentCode
1196760
Title
Robust fabric defect detection and classification using multiple adaptive wavelets
Author
Yang, X. ; Pang, G. ; Yung, N.
Author_Institution
Dept. of Electr. & Electron. Eng., Univ. of Hong Kong, China
Volume
152
Issue
6
fYear
2005
Firstpage
715
Lastpage
723
Abstract
The wavelet transform has been widely used for defect detection and classification in fabric images. The detection and classification performance of the wavelet transform approach is closely related to the selection of the wavelet. Instead of predetermining a wavelet, a method of designing a wavelet to adapt to the detection or classification of fabric defects has been developed. For further improvement of the performance, the paper extends the adaptive wavelet-based methodology from the use of a single adaptive wavelet to multiple adaptive wavelets. For each class of fabric defect, a defect-specific adaptive wavelet was designed to enhance the defect region at one channel of the wavelet transform, where the defect region can be detected by using a simple threshold classifier. Corresponding to the multiple defect-specific adaptive wavelets, the multiscale edge responses to defect regions have been shown to be more efficient in characterising defects, which leads to a new approach to the classification of defects. In comparison with the single adaptive wavelet approach, the use of multiple adaptive wavelets yields better performance on defect detection and classification, especially for defects that are poorly detected by the single adaptive wavelet approach. The proposed method has been evaluated on the inspection of 56 images containing eight classes of fabric defects, and 64 images without defects. In defect detection, 98.2% detection rate and 1.5% false alarm rate were achieved, and in defect classification, 97.5% accuracy was achieved.
Keywords
automatic optical inspection; edge detection; fabrics; image classification; image texture; object detection; wavelet transforms; automated inspection; classification accuracy; defect-specific adaptive wavelet; detection rate; fabric defect classification; fabric defect detection; fabric images; false alarm rate; multiple adaptive wavelets; multiscale edge responses; periodic texture patterns; threshold classifier; wavelet transform;
fLanguage
English
Journal_Title
Vision, Image and Signal Processing, IEE Proceedings -
Publisher
iet
ISSN
1350-245X
Type
jour
DOI
10.1049/ip-vis:20045131
Filename
1520855
Link To Document