• DocumentCode
    119679
  • Title

    Investigation by simulation of the influence of vacuum reduction on time of flight mass spectra

  • Author

    Tawfik, Nourane G. ; Edward, Mina S. ; Gunzer, Frank

  • Author_Institution
    Electr. Eng. Dept., German Univ. in Cairo Cairo, Cairo, Egypt
  • fYear
    2014
  • fDate
    17-18 Sept. 2014
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Mass spectrometry is an important technique for environmental monitoring, especially for gaseous substances as e.g. in air pollution monitoring. Devices using a certain technique of this family, time of flight mass spectrometers, have a very high selectivity, a very good sensitivity in the ppm range, but a quite large device footprint also due to the size of necessary vacuum pumps. It is a thus very actual goal to have a gas analyzer with the same positive characteristics as a time of flight mass spectrometer, but at smaller size. Any successful size reduction would have to include the vacuum pumps, which normally would then lead to a reduction of the vacuum inside the device. Here we analyzed the influence of a vacuum reduction on the device characteristics (signal intensity, resolving power) with help of finite element method studies in order to find out how much the pressure can be increased in standard time of flight mass spectrometers without compromising the good performance normally obtained.
  • Keywords
    air pollution; chemical analysis; time of flight mass spectrometers; vacuum pumps; air pollution monitoring; environmental monitoring; finite element method; gas analyzer; mass spectrometry; time-of-flight mass spectra; vacuum pumps; vacuum reduction; Detectors; Electric fields; Electrodes; Electron tubes; Finite element analysis; Ion sources; Signal resolution; Wiley-McLaren ion source; finite element method; mass spectrometry; resolving power;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Environmental Energy and Structural Monitoring Systems (EESMS), 2014 IEEE Workshop on
  • Conference_Location
    Naples
  • Print_ISBN
    978-1-4799-4989-2
  • Type

    conf

  • DOI
    10.1109/EESMS.2014.6923269
  • Filename
    6923269