1197141

Methods for extracting parameters and modeling integrated interconnections and devices from mask descriptions

Harbour, M. Glez

34

6

1987

6/1/1987 12:00:00 AM

701

701

Distributed-parameter circuits; Integrated circuit interconnections; Interconnections, Integrated circuits; Parameter estimation; Admittance; Conductors; Contact resistance; Delay effects; Finite difference methods; Integral equations; Mesh networks; Physics; Resistors; Shape;

English

Circuits and Systems, IEEE Transactions on

ieee

0098-4094

jour

10.1109/TCS.1987.1086180

1086180