Title :
Current mirror structure insensitive to conducted EMI
Author :
Redouté, J.-M ; Steyaert, M.
Author_Institution :
Dept. Elektrotechniek, Katholieke Univ. Leuven, Leuven-Heverlee, Belgium
Abstract :
A novel and integrable current mirror structure insensitive to the common charge pumping phenomenon, typically occasioned by conducted electromagnetic interference (EMI), is presented.
Keywords :
charge injection; current mirrors; electromagnetic interference; EMI conduction; charge pumping; current mirrors; electromagnetic interference; integrable current mirror structure;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:20052825
