Title :
Technique to improve linearity of transconductor with bias offset voltages controlling a tail current
Author :
Yamaguchi, I. ; Matsumoto, F. ; Noguchi, Y.
Author_Institution :
Dept. of Appl. Phys., Nat. Defense Acad., Kanagawa, Japan
Abstract :
Considering mobility degradation, a transfer characteristic of the transconductor using bias offset technique becomes nonlinear. Proposed is a technique to cancel the nonlinearity controlling a tail current. Using the proposed technique, the transconductance error is improved to 1/50 of that of the conventional circuit.
Keywords :
MOS analogue integrated circuits; current mirrors; bias offset voltage; mobility degradation; tail current; transconductance error; transconductor linearity; transfer characteristic;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:20052731