DocumentCode :
1197369
Title :
Noise in high Tc superconductors
Author :
Kiss, Lászió B. ; Svedlindh, Peter
Author_Institution :
Inst. of Technol., Uppsala Univ., Sweden
Volume :
41
Issue :
11
fYear :
1994
fDate :
11/1/1994 12:00:00 AM
Firstpage :
2112
Lastpage :
2122
Abstract :
Very recently, significant progress has been achieved in the understanding of the excessive strength and behavior of the conductance noise in the conductor-superconductor transition region of high Tc superconductors. For the high temperature part of the conductor-superconductor transition region, the model incorporates number and mobility noises of charge carriers: while in the low temperature part of the transition, classical and novel percolation noise effects (including possible effects due to flux motion) determine the behavior of the measured noise. In present high-quality (in situ annealed) films, the novel percolation noise effect (“p-noise,” Phys. Rev. Lett., vol. 71, p. 2817, 1993) seems to be the most important. Some other important topics will also be briefly examined in this review: magnetic noise, noise in devices, and practical problems of measurements (e.g., comparison of the noise of different materials, temperature fluctuations)
Keywords :
carrier mobility; flux flow; high-temperature superconductors; percolation; reviews; superconducting device noise; superconducting junction devices; superconducting thin films; superconducting transition temperature; charge carriers; conductance noise; conductor-superconductor transition region; flux motion; high Tc superconductors; magnetic noise; mobility noise; number noise; percolation noise; superconducting thin films; temperature fluctuations; Charge carriers; Charge measurement; Current measurement; High temperature superconductors; Magnetic materials; Magnetic noise; Motion measurement; Noise measurement; Superconducting device noise; Superconducting transition temperature;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/16.333830
Filename :
333830
Link To Document :
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