Calculating the effects of linear dependencies in m-sequences used as test stimuli

Author

Bardell, Paul H.

Author_Institution

IBM Corp., Poughkeepsie, NY, USA

Volume

11

Issue

1

fYear

1992

fDate

1/1/1992 12:00:00 AM

Firstpage

83

Lastpage

86

Abstract

When pseudorandom patterns generated by a linear feedback shift register (LFSR) are used as test stimuli, there is always a concern about the linear dependencies within the sequence of patterns. It is possible for these linear dependencies to preclude a specific test pattern from being present in the sequence of applied patterns. These dependencies and ways to calculate their effects on a particular test are discussed, with the goal of developing the means of analyzing a digital circuit which is connected to a source of pseudorandom patterns to determine whether or not linear dependencies are encountered by a particular connection

Keywords

logic testing; shift registers; digital circuit; linear dependencies; linear feedback shift register; m-sequences; pseudorandom patterns; test stimuli; Built-in self-test; Circuit analysis; Circuit testing; Linear feedback shift registers; Pattern analysis; Polynomials; Random sequences; Shift registers; Statistics; Test pattern generators;

fLanguage

English

Journal_Title

Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on

Publisher

ieee

ISSN

0278-0070

Type

jour

DOI

10.1109/43.108621

Filename

108621