DocumentCode :
1197478
Title :
Spectral and Short Term Stability Measurements
Author :
Groslambert, Jacques ; Olivier, Marcel ; Uebersfeld, Jean
Volume :
23
Issue :
4
fYear :
1974
Firstpage :
518
Lastpage :
521
Abstract :
The noise performance of an oscillator can be given either in the spectral or in the time domain. Two types of apparatus are generally necessary to measure these noise characteristics, spectral analyzers and frequency counters. The system described uses spectral density to time domain conversion and measures both the short term frequency stability and the phase spectral density of an oscillator. Bias functions, depending on the spectral density, are calculated. They are used to determine systematic errors introduced by the apparatus.
Keywords :
Counting circuits; Density measurement; Frequency conversion; Frequency measurement; Noise measurement; Oscillators; Phase measurement; Spectral analysis; Stability; Time measurement;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/TIM.1974.4314344
Filename :
4314344
Link To Document :
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