DocumentCode :
1197549
Title :
Demonstration of 4H-SiC visible-blind EUV and UV detector with large detection area
Author :
Xin, X. ; Yan, F. ; Koeth, T.W. ; Joseph, C. ; Hu, J. ; Wu, J. ; Zhao, J.H.
Author_Institution :
SiCLAB, Rutgers Univ., Piscataway, NJ, USA
Volume :
41
Issue :
21
fYear :
2005
Firstpage :
1192
Lastpage :
1193
Abstract :
4H-SiC visible-blind photodetectors specially designed for extreme ultraviolet (EUV) as well as ultraviolet (UV) detection are fabricated and characterised. Spectral quantum efficiency (QE) from 21.5 to 400 nm is determined. The devices have a 2×2 mm active area and less than 1 pA leakage current at low bias. The peak QE is 40-45% around 270 nm. Between 120-200 nm, the detector QE is about 4-20%. EUV light generates multiple electron hole pairs in the range of 21.5 to 77.5 nm, resulting in an apparent QE above 140% at 21.5 nm.
Keywords :
leakage currents; photodetectors; silicon compounds; ultraviolet detectors; wide band gap semiconductors; 1 pA; 2 mm; 21.5 to 400 nm; SiC; UV detector; electron hole pairs; large detection area; leakage current; photo detectors; spectral quantum efficiency; visible-blind EUV detector;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el:20052977
Filename :
1522030
Link To Document :
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