DocumentCode
1197549
Title
Demonstration of 4H-SiC visible-blind EUV and UV detector with large detection area
Author
Xin, X. ; Yan, F. ; Koeth, T.W. ; Joseph, C. ; Hu, J. ; Wu, J. ; Zhao, J.H.
Author_Institution
SiCLAB, Rutgers Univ., Piscataway, NJ, USA
Volume
41
Issue
21
fYear
2005
Firstpage
1192
Lastpage
1193
Abstract
4H-SiC visible-blind photodetectors specially designed for extreme ultraviolet (EUV) as well as ultraviolet (UV) detection are fabricated and characterised. Spectral quantum efficiency (QE) from 21.5 to 400 nm is determined. The devices have a 2×2 mm active area and less than 1 pA leakage current at low bias. The peak QE is 40-45% around 270 nm. Between 120-200 nm, the detector QE is about 4-20%. EUV light generates multiple electron hole pairs in the range of 21.5 to 77.5 nm, resulting in an apparent QE above 140% at 21.5 nm.
Keywords
leakage currents; photodetectors; silicon compounds; ultraviolet detectors; wide band gap semiconductors; 1 pA; 2 mm; 21.5 to 400 nm; SiC; UV detector; electron hole pairs; large detection area; leakage current; photo detectors; spectral quantum efficiency; visible-blind EUV detector;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:20052977
Filename
1522030
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