• DocumentCode
    1197549
  • Title

    Demonstration of 4H-SiC visible-blind EUV and UV detector with large detection area

  • Author

    Xin, X. ; Yan, F. ; Koeth, T.W. ; Joseph, C. ; Hu, J. ; Wu, J. ; Zhao, J.H.

  • Author_Institution
    SiCLAB, Rutgers Univ., Piscataway, NJ, USA
  • Volume
    41
  • Issue
    21
  • fYear
    2005
  • Firstpage
    1192
  • Lastpage
    1193
  • Abstract
    4H-SiC visible-blind photodetectors specially designed for extreme ultraviolet (EUV) as well as ultraviolet (UV) detection are fabricated and characterised. Spectral quantum efficiency (QE) from 21.5 to 400 nm is determined. The devices have a 2×2 mm active area and less than 1 pA leakage current at low bias. The peak QE is 40-45% around 270 nm. Between 120-200 nm, the detector QE is about 4-20%. EUV light generates multiple electron hole pairs in the range of 21.5 to 77.5 nm, resulting in an apparent QE above 140% at 21.5 nm.
  • Keywords
    leakage currents; photodetectors; silicon compounds; ultraviolet detectors; wide band gap semiconductors; 1 pA; 2 mm; 21.5 to 400 nm; SiC; UV detector; electron hole pairs; large detection area; leakage current; photo detectors; spectral quantum efficiency; visible-blind EUV detector;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:20052977
  • Filename
    1522030