• DocumentCode
    1197652
  • Title

    Dual-Ramp A/D Converter Error Due to Nonideal Integrator Capacitor

  • Author

    Buchanan, James E.

  • Volume
    24
  • Issue
    1
  • fYear
    1975
  • fDate
    3/1/1975 12:00:00 AM
  • Firstpage
    33
  • Lastpage
    39
  • Abstract
    It is shown that very high accuracy hybrid packaged dual-ramp analog-to-digital converters can be built using ceramic NPO-type chip capacitors that exhibit a dielectric absorption specification of 0.75 percent. Capacitor recovery voltage is shown versus time for several 0.01-/g-m/F NPO-type ceramic capacitors. An absorptive capacitor model for the NPO capacitor is shown. Typical component values for an absorptive model of an 0.01-/g=m/F NPO capacitor are determined. The worst case integrator error due to dielectric absorption in a particular synchro-to-digital converter utilizing two dual-ramp converters with 0.01-/g=m/F integrator capacitors is shown to be in the order of microvolts.
  • Keywords
    Absorption; Analog-digital conversion; Capacitance; Capacitors; Ceramics; Dielectric constant; Dielectric materials; High-K gate dielectrics; Packaging; Voltage;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/TIM.1975.4314365
  • Filename
    4314365