DocumentCode
1197660
Title
A Method to Eliminate Drift Effects in Hall Mobility Measurements
Author
Van Campenhout, Jean M.
Volume
24
Issue
1
fYear
1975
fDate
3/1/1975 12:00:00 AM
Firstpage
39
Lastpage
42
Abstract
This article describes some problems concerning the measurement of the Hall mobility of semiconductor layers. A method is proposed by which the measurement of relevant parameters is automated. The introduction into the system of a low-cost desk calculator allows for considerable increase in accuracy and yields on-line computation capability.
Keywords
Charge carriers; Charge measurement; Current measurement; Geometry; Hall effect; Magnetic field measurement; Magnetic noise; Noise measurement; Time measurement; Voltage;
fLanguage
English
Journal_Title
Instrumentation and Measurement, IEEE Transactions on
Publisher
ieee
ISSN
0018-9456
Type
jour
DOI
10.1109/TIM.1975.4314366
Filename
4314366
Link To Document