Title :
Rapid Measurement of Dielectric Substrate Permittivity at X Band
fDate :
3/1/1975 12:00:00 AM
Abstract :
A technique for rapid measurements at 8-12 GHz of dielectric substrate permittivities in the range ¿ ~9-100 is described using a novel resonant cavity configuration for inserting and removing substrate samples.
Keywords :
Councils; Counting circuits; Dielectric measurements; Dielectric substrates; Frequency measurement; Microwave measurements; Oscillators; Permittivity measurement; Position measurement; Resonance;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
DOI :
10.1109/TIM.1975.4314375
