• DocumentCode
    1198027
  • Title

    On a new measure of system diagnosability in presence of hybrid faults

  • Author

    Sengupta, Abhijit ; Durham, Stephen D. ; Sen, Arunabha ; Bandyopadhyay, Subir

  • Volume
    34
  • Issue
    9
  • fYear
    1987
  • fDate
    9/1/1987 12:00:00 AM
  • Firstpage
    1053
  • Lastpage
    1058
  • Abstract
    This paper deals with the problem of testing the diagnosability of a system when the units of the system may fail permanently or intermittently. It takes into account the fact that different units of a system have different probabilities of failing permanently and intermittently. For each unit, these probabilities are computed assuming a continuous parameter Markov model. It has also been shown that, with this choice of model, the incompleteness of diagnosis (i.e., an intermittently failing unit classified as faultfree) can be avoided up to any level of confidence.
  • Keywords
    Fault analysis; Fault diagnosis; Markov processes; Circuit faults; Circuit testing; Circuits and systems; Computer science; Councils; Fault diagnosis; Helium; Statistics; System testing; Upper bound;
  • fLanguage
    English
  • Journal_Title
    Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0098-4094
  • Type

    jour

  • DOI
    10.1109/TCS.1987.1086266
  • Filename
    1086266