Title :
A Fourier theory for cast shadows
Author :
Ramamoorthi, Ravi ; Koudelka, Melissa ; Belhumeur, Peter
Author_Institution :
Dept. of Comput. Sci., Columbia Univ., New York, NY, USA
Abstract :
Cast shadows can be significant in many computer vision applications, such as lighting-insensitive recognition and surface reconstruction. Nevertheless, most algorithms neglect them, primarily because they involve nonlocal interactions in nonconvex regions, making formal analysis difficult. However, many real instances map closely to canonical configurations like a wall, a V-groove type structure, or a pitted surface. In particular, we experiment with 3D textures like moss, gravel, and a kitchen sponge, whose surfaces include canonical configurations like V-grooves. This paper takes a first step toward a formal analysis of cast shadows, showing theoretically that many configurations can be mathematically analyzed using convolutions and Fourier basis functions. Our analysis exposes the mathematical convolution structure of cast shadows and shows strong connections to recent signal-processing frameworks for reflection and illumination.
Keywords :
Fourier analysis; computer vision; convolution; image texture; 3D textures; Fourier basis functions; Fourier theory; V-grooves; canonical configurations; cast shadows; computer vision; formal analysis; gravel; illumination; kitchen sponge; lighting insensitive recognition; mathematical convolution structure analysis; moss; signal processing; surface reconstruction; Algorithm design and analysis; Application software; Computer vision; Convolution; Jacobian matrices; Lighting; Optical reflection; Shadow mapping; Surface reconstruction; Surface texture; Fourier analysis; Index Terms- Cast shadows; V-grooves.; convolution; eigenmodes; Algorithms; Artificial Intelligence; Computer Graphics; Fourier Analysis; Image Enhancement; Image Interpretation, Computer-Assisted; Imaging, Three-Dimensional; Information Storage and Retrieval; Light; Pattern Recognition, Automated; Reproducibility of Results; Sensitivity and Specificity; Signal Processing, Computer-Assisted;
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on
DOI :
10.1109/TPAMI.2005.22