DocumentCode
1198144
Title
Exchange biasing schemes for MR disk heads
Author
Yuan, Samuel W.
Author_Institution
Appl. Magnetics Corp., Goleta, CA, USA
Volume
30
Issue
6
fYear
1994
fDate
11/1/1994 12:00:00 AM
Firstpage
3849
Lastpage
3851
Abstract
Three-dimensional micromagnetic model is utilized to compare narrow track-width MR disk head performances under various exchange biasing schemes. Patterned exchange biasing only the MR layer leads to side-reading instability, which can be partially alleviated by additional patterned exchange on the SAL. However, a uniform exchange over the entire SAL along the transverse direction is shown to be most effective to ensure head stability and high sensitivity. An optimum exchange orientation on the MR film also exists due to the trade-off between output signal and pulse distortion
Keywords
magnetic heads; magnetoresistive devices; modelling; sensitivity; stability; 3D model; MR disk heads; disk head performances; exchange biasing schemes; head stability; high sensitivity; magnetoresistive head; optimum exchange orientation; patterned exchange; side-reading instability; three-dimensional micromagnetic model; uniform exchange; Current density; Distortion; File systems; Magnetic heads; Magnetic sensors; Magnetoresistance; Micromagnetics; Performance analysis; Saturation magnetization; Stability analysis;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/20.333921
Filename
333921
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