Title :
Exchange biasing schemes for MR disk heads
Author_Institution :
Appl. Magnetics Corp., Goleta, CA, USA
fDate :
11/1/1994 12:00:00 AM
Abstract :
Three-dimensional micromagnetic model is utilized to compare narrow track-width MR disk head performances under various exchange biasing schemes. Patterned exchange biasing only the MR layer leads to side-reading instability, which can be partially alleviated by additional patterned exchange on the SAL. However, a uniform exchange over the entire SAL along the transverse direction is shown to be most effective to ensure head stability and high sensitivity. An optimum exchange orientation on the MR film also exists due to the trade-off between output signal and pulse distortion
Keywords :
magnetic heads; magnetoresistive devices; modelling; sensitivity; stability; 3D model; MR disk heads; disk head performances; exchange biasing schemes; head stability; high sensitivity; magnetoresistive head; optimum exchange orientation; patterned exchange; side-reading instability; three-dimensional micromagnetic model; uniform exchange; Current density; Distortion; File systems; Magnetic heads; Magnetic sensors; Magnetoresistance; Micromagnetics; Performance analysis; Saturation magnetization; Stability analysis;
Journal_Title :
Magnetics, IEEE Transactions on