• DocumentCode
    1198144
  • Title

    Exchange biasing schemes for MR disk heads

  • Author

    Yuan, Samuel W.

  • Author_Institution
    Appl. Magnetics Corp., Goleta, CA, USA
  • Volume
    30
  • Issue
    6
  • fYear
    1994
  • fDate
    11/1/1994 12:00:00 AM
  • Firstpage
    3849
  • Lastpage
    3851
  • Abstract
    Three-dimensional micromagnetic model is utilized to compare narrow track-width MR disk head performances under various exchange biasing schemes. Patterned exchange biasing only the MR layer leads to side-reading instability, which can be partially alleviated by additional patterned exchange on the SAL. However, a uniform exchange over the entire SAL along the transverse direction is shown to be most effective to ensure head stability and high sensitivity. An optimum exchange orientation on the MR film also exists due to the trade-off between output signal and pulse distortion
  • Keywords
    magnetic heads; magnetoresistive devices; modelling; sensitivity; stability; 3D model; MR disk heads; disk head performances; exchange biasing schemes; head stability; high sensitivity; magnetoresistive head; optimum exchange orientation; patterned exchange; side-reading instability; three-dimensional micromagnetic model; uniform exchange; Current density; Distortion; File systems; Magnetic heads; Magnetic sensors; Magnetoresistance; Micromagnetics; Performance analysis; Saturation magnetization; Stability analysis;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.333921
  • Filename
    333921