Title :
The effect of rise time and field gradient on nonlinear bit shift in thin film heads
Author :
Torabi, Adam F. ; Mallary, Michael L. ; Marshall, Steve
Author_Institution :
Digital Equipment Corp., Shrewsbury, MA, USA
fDate :
11/1/1994 12:00:00 AM
Abstract :
We present a discussion of nonlinear bit shift in thin film inductive heads. A three dimensional finite element model and two dimensional dynamic and self consistent model were used to calculate the nonlinear bit shift as a function of rise time, write current waveform and pole tip saturation. The analysis shows a strong dependency of nonlinear bit shift on rise time and write pole magnetic image. A comparison of experimental data with the theoretical model is presented
Keywords :
finite element analysis; magnetic heads; magnetic thin film devices; modelling; 2D dynamic model; 3D FEM model; field gradient; nonlinear bit shift; pole tip saturation; rise time; thin film inductive heads; three dimensional finite element model; write current waveform; write pole magnetic image; Channel coding; Delay; Finite element methods; Intersymbol interference; Magnetic flux; Magnetic heads; Saturation magnetization; Shape; Transistors; Writing;
Journal_Title :
Magnetics, IEEE Transactions on
