Title :
High-speed computation of the Radon transform and backprojection using an expandable multiprocessor architecture
Author :
Shieh, Eric ; Current, K. Wayne ; Hurst, Paul J. ; Agi, Iskender
Author_Institution :
Dept. of Electr. & Comput. Eng., California Univ., Davis, CA, USA
fDate :
12/1/1992 12:00:00 AM
Abstract :
The accuracy and speed characteristics of implementations of several line integration models required for Radon (1917) transform (used for computed tomography image reconstruction) and backprojection computations are described and compared. The fixed-point number system used is evaluated by error comparisons to identical floating-point calculations. An expandable multiprocessor architecture for high-speed computation that has been realized as a prototype using commercially available digital signal processor (DSP) chips as the basic processing elements is described. The simulated performances of two popular DSP chips for this application are discussed and compared. Performance characteristics of the complete prototype hardware system are presented. The computational speed of a four-chip system is measured to be more than 190 times better than that of a Sun 3/160 with a math coprocessor. The architecture and prototype organization are not dependent on the DSP chip chosen, and substitution of the most up-to-date DSP chips can yield even better speed performance
Keywords :
computerised tomography; digital signal processing chips; medical image processing; multiprocessing systems; transforms; DSP chips; Radon transform; accuracy; backprojection; computational speed; computer tomography image reconstruction; digital signal processor; error comparisons; expandable multiprocessor architecture; fixed-point number system; floating-point calculations; line integration models; prototype hardware system; simulated performances; speed characteristics; speed performance; Computational modeling; Computed tomography; Computer architecture; Digital signal processing chips; Digital signal processors; Hardware; Image reconstruction; Prototypes; Semiconductor device measurement; Velocity measurement;
Journal_Title :
Circuits and Systems for Video Technology, IEEE Transactions on