DocumentCode :
1198320
Title :
Optimum Bivariate Step-Stress Accelerated Life Test for Censored Data
Author :
Li, Chenhua ; Fard, Nasser
Author_Institution :
Dept. of Mech. & Ind. Eng., Northeastern Univ., Boston, MA
Volume :
56
Issue :
1
fYear :
2007
fDate :
3/1/2007 12:00:00 AM
Firstpage :
77
Lastpage :
84
Abstract :
A step-stress accelerated life test for two stress variables is developed. The time to failure follows the Weibull distribution, and the test is subject to termination at a predetermined time, leading to censored failure data. An optimum test plan is developed to determine the test interval for each combination of stress levels. The scale parameter of the Weibull distribution for each combination of stress levels is defined as a log linear function of the stress levels. The optimal criterion is defined to minimize the asymptotic variance of the maximum likelihood estimator of the life for a specified reliability
Keywords :
Weibull distribution; failure analysis; life testing; maximum likelihood estimation; reliability theory; Weibull distribution; asymptotic variance; censored failure data; log linear function; maximum likelihood estimator; optimum bivariate step-stress accelerated life testing; optimum test plan; time-to-failure; Data analysis; Helium; Industrial engineering; Life estimation; Life testing; Maximum likelihood estimation; Shape; Stress; System testing; Weibull distribution; Accelerated test; Weibull distribution; censored data; maximum likelihood estimator; step-stress;
fLanguage :
English
Journal_Title :
Reliability, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9529
Type :
jour
DOI :
10.1109/TR.2006.890897
Filename :
4118424
Link To Document :
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