Title :
Correlation between noise-after-write and magnetic domain structure conversions in thin-film heads by electron microscopy
Author :
Kobayashi, Kazuo
Author_Institution :
Fujitsu Labs. Ltd., Atsugi, Japan
fDate :
11/1/1994 12:00:00 AM
Abstract :
Noise-after-write in thin film heads has been reported, but the sources have not yet been identified. Using an electron microscope, we observed the magnetic domain structure conversions after writing to find these noise sources. Magnetic domain observation consisted of an image lock-in technique for backscattered electron contrast (Type II) using a 200 kV scanning electron microscope. There was a strong correlation between noise-after-write and domain structure conversions, and noise-after-write is generated mainly near the backgap closure
Keywords :
magnetic domains; magnetic heads; magnetic recording noise; magnetic thin film devices; scanning electron microscopy; 200 kV; Type II; backgap closure; backscattered electron contrast; electron microscopy; image lock-in technique; magnetic domain structure conversions; noise-after-write; scanning electron microscope; thin-film heads; Electron microscopy; Image converters; Magnetic domains; Magnetic force microscopy; Magnetic heads; Magnetic noise; Noise generators; Scanning electron microscopy; Transistors; Writing;
Journal_Title :
Magnetics, IEEE Transactions on
