• DocumentCode
    1198417
  • Title

    Corrections to "Challenges related to reliability in nano electronics"

  • Author

    Kuo, Wei-Hung

  • Volume
    56
  • Issue
    1
  • fYear
    2007
  • fDate
    3/1/2007 12:00:00 AM
  • Firstpage
    169
  • Lastpage
    169
  • Abstract
    The author makes two modifications to his original paper (see ibid., vol.55, no.4, p.569-70, Dec. 2006).
  • Keywords
    nanoelectronics; reliability; nanoelectronics; reliability; Costs; Life estimation; Nanotechnology Council; Physics computing; Plasma displays;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/TR.2006.890224
  • Filename
    4118435
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1198417