مرکز منطقه ای اطلاع رساني علوم و فناوري - Corrections to "Challenges related to reliability in nano electronics"

DocumentCode :

1198417

Title :

Corrections to "Challenges related to reliability in nano electronics"

Author :

Kuo, Wei-Hung

Volume :

Issue :

fYear :

2007

fDate :

3/1/2007 12:00:00 AM

Firstpage :

169

Lastpage :

169

Abstract :

The author makes two modifications to his original paper (see ibid., vol.55, no.4, p.569-70, Dec. 2006).

Keywords :

nanoelectronics; reliability; nanoelectronics; reliability; Costs; Life estimation; Nanotechnology Council; Physics computing; Plasma displays;

fLanguage :

English

Journal_Title :

Reliability, IEEE Transactions on

Publisher :

ieee

ISSN :

0018-9529

Type :

jour

DOI :

10.1109/TR.2006.890224

Filename :

4118435

Link To Document :