Effect of very thin Cr-underlayer on the magnetic and recording properties of CoCrTa thin-film media

Author

Lal, Brij B. ; Tobise, M. ; Shinohara, T.

Author_Institution

HMT Technol., Fremont, CA, USA

Volume

30

Issue

6

fYear

1994

fDate

11/1/1994 12:00:00 AM

Firstpage

3954

Lastpage

3956

Abstract

A process has been developed which uses very thin Cr-underlayer for CoCrTa-media for high-density recording. The media sputtered using this technique revealed that by decreasing Cr-underlayer thickness from 2000 Å to 200 Å, orientation-ratio increased from 1.27 to 1.6, squareness-ratio increased from 0.81 to 0.86, and Mrt increased from 3.25 to 3.97 memu/cm². The Mr value is increased because of the higher squareness. The higher Mr gives a higher Mrt product which produced higher signal output by about 10%. Also, the noise performance was comparable for the media with thin and thick Cr-underlayers. X-ray diffraction patterns showed strong in-plane preferred orientations, Cr(200) and Co(112¯0) textures as a function of Cr-underlayer thickness

Keywords

X-ray diffraction; chromium; chromium alloys; cobalt alloys; coercive force; ferromagnetic materials; magnetic disc storage; magnetic recording noise; magnetic thin film devices; magnetic thin films; sputtered coatings; tantalum alloys; 200 angstrom; CoCrTa-Cr; CoCrTa/Cr thin-film media; X-ray diffraction patterns; high-coercivity media; high-density recording; magnetic properties; noise performance; orientation-ratio; recording properties; signal output; sputter deposition; squareness-ratio; Chromium; Coercive force; Crystallography; Magnetic films; Magnetic noise; Magnetic properties; Magnetic recording; Sputtering; Substrates; X-ray diffraction;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.333955

Filename

333955