• DocumentCode
    1198496
  • Title

    Accelerated Life Test Planning With Independent Weibull Competing Risks With Known Shape Parameter

  • Author

    Pascual, Francis

  • Author_Institution
    Dept. of Math., Washington State Univ., Pullman, WA
  • Volume
    56
  • Issue
    1
  • fYear
    2007
  • fDate
    3/1/2007 12:00:00 AM
  • Firstpage
    85
  • Lastpage
    93
  • Abstract
    This article presents methodology for accelerated life test (ALT) planning when there are two or more failure modes, or competing risks which are dependent on one accelerating factor. It is assumed that the failure modes have respective latent (unobservable) failure times, and the minimum of these times corresponds to the product lifetime. The latent failure times are assumed to be s-independently distributed Weibull with known, common shape parameter. Expressions for the Fisher information matrix, and test plan criteria are presented. The methodology is applied to the ALT of Class-H insulation for motorettes, where temperature is the accelerating factor. Two-level, and 4:2:1 allocation test plans based on determinants, and on estimating quantiles or hazard functions, are presented. Sensitivity of optimal test plans to the specified Weibull shape parameter is also studied
  • Keywords
    Weibull distribution; failure analysis; life testing; matrix algebra; maximum likelihood estimation; planning; reliability theory; Arrhenius relationship; Fisher information matrix; Weibull distribution; Weibull shape parameter; accelerated life test planning; asymptotic variance; independent Weibull competing risk; inverse power relationship; maximum likelihood estimation; optimal test plan criteria; product lifetime; time failure censoring; Acceleration; Hazards; Insulation; Life estimation; Life testing; Maximum likelihood estimation; Shape; Stress; Temperature; Voltage; $D$-optimality; $D_{s}$-optimality; Arrhenius relationship; Fisher information matrix; asymptotic variance; inverse power relationship; maximum likelihood estimation; optimal test plan; time failure censoring;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/TR.2006.890885
  • Filename
    4118444