• DocumentCode
    1198561
  • Title

    Coercivity-gradient bi-layered thin-film media for longitudinal recording

  • Author

    Lal, Brij B. ; Shinohara, T.

  • Author_Institution
    HMT Technol., Fremont, CA, USA
  • Volume
    30
  • Issue
    6
  • fYear
    1994
  • fDate
    11/1/1994 12:00:00 AM
  • Firstpage
    3981
  • Lastpage
    3983
  • Abstract
    A new coercivity-structure was proposed, and a new process technique was developed for controlling the Hc of second and subsequent magnetic-layers in multi-layer media. A narrow slit cathode was used to sputter Cr-interlayer. Conventional and new Hc-gradient CoCrTa-bi-layer media were sputtered by varying Cr-interlayer thickness 0-25 Å with fixed Cr-underlayer and magnetic layers. In one case, to achieve higher Hc for the top-magnetic layer, Hc gradient bilayer media of Mrt:3.6 memu/cm2 were sputtered by using 250 V DC-bias during second magnetic-layer deposition which produced about 300 Oe higher Hc for the top-layer. The bi-layer media reduced media-noise about 30% and increased SNR about 5 dB in comparison to mono-layer media at 66.3 KFCI recording-density. However, conventional bi-layer media produced about 6-7 dB lower overwrite (OW) in comparison to mono-layer media, whereas the new Hc-gradient bi-layer media with higher Hc showed about 5 dB higher OW and 5-12% higher HF-amplitude in comparison to conventional bi-layer media
  • Keywords
    chromium; chromium alloys; cobalt alloys; coercive force; magnetic multilayers; magnetic recording noise; sputtered coatings; tantalum alloys; CoCrTa-Cr; CoCrTa-bi-layer; Cr-interlayer; DC-bias sputtering; HF-amplitude; SNR; coercivity-gradient bi-layered thin-film media; longitudinal recording; magnetic-layers; media-noise; multi-layer media; narrow slit cathode; overwrite; recording-density; Chromium; Coercive force; Magnetic films; Magnetic flux; Magnetic noise; Magnetic separation; Saturation magnetization; Sputtering; Substrates; Transistors;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.333964
  • Filename
    333964