Title :
Field discontinuity refinement criteria and optimal discretizations in adaptive finite-element electromagnetic analysis for microelectronic system interconnections
Author :
Giannacopoulos, Dennis
Author_Institution :
Dept. of Electr. & Comput. Eng., McGill Univ., Montreal, Que., Canada
fDate :
5/1/2003 12:00:00 AM
Abstract :
The effectiveness of field-discontinuity refinement criteria for achieving optimal finite element discretizations is investigated. The criteria are first examined directly with finite-element solutions computed from optimally discretized systems. Subsequently, the optimality of the criteria are evaluated for practical adaptive finite-element electromagnetic analysis of principal device features in modern microelectronic system interconnection structures.
Keywords :
adaptive systems; finite element analysis; integrated circuit interconnections; adaptive finite-element electromagnetic analysis; field discontinuity refinement criteria; interconnection structures; microelectronic system interconnections; optimal discretizations; principal device features; Analytical models; Computational modeling; Computer simulation; Design automation; Electromagnetic analysis; Electromagnetic fields; Electromagnetic modeling; Error analysis; Finite element methods; Microelectronics;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.2003.810383
