• DocumentCode
    1198868
  • Title

    Thermal crisis: challenges and potential solutions

  • Author

    Shang, Li ; Dick, Robert P.

  • Volume
    25
  • Issue
    5
  • fYear
    2006
  • Firstpage
    31
  • Lastpage
    35
  • Abstract
    This paper describes integrated circuits (IC), which is denser, faster and cheaper. In the increasing system integration, as well as aggressive technology scaling, IC thermal issues now stand in the way of improved IC performance and by increasing transistors counts and aggressive frequency scaling result in as significant increase in chip-power density, and also its temperature. In order to avoid thermal crisis, we must simultaneously and cooperatively address thermal issues at each stage of the design process: during packaging and cooling design, architecture design, circuit design, fabrication and the development of novel devices
  • Keywords
    CMOS integrated circuits; cooling; integrated circuit design; integrated circuit packaging; thermal management (packaging); CMOS; IC thermal issue; cooling design; integrated circuit fabrication; packaging; Cooling; Microprocessors; Packaging; Resource management; Runtime; Temperature; Thermal conductivity; Thermal force; Thermal management; Thermal resistance;
  • fLanguage
    English
  • Journal_Title
    Potentials, IEEE
  • Publisher
    ieee
  • ISSN
    0278-6648
  • Type

    jour

  • DOI
    10.1109/MP.2006.1692283
  • Filename
    1692283