DocumentCode
1198868
Title
Thermal crisis: challenges and potential solutions
Author
Shang, Li ; Dick, Robert P.
Volume
25
Issue
5
fYear
2006
Firstpage
31
Lastpage
35
Abstract
This paper describes integrated circuits (IC), which is denser, faster and cheaper. In the increasing system integration, as well as aggressive technology scaling, IC thermal issues now stand in the way of improved IC performance and by increasing transistors counts and aggressive frequency scaling result in as significant increase in chip-power density, and also its temperature. In order to avoid thermal crisis, we must simultaneously and cooperatively address thermal issues at each stage of the design process: during packaging and cooling design, architecture design, circuit design, fabrication and the development of novel devices
Keywords
CMOS integrated circuits; cooling; integrated circuit design; integrated circuit packaging; thermal management (packaging); CMOS; IC thermal issue; cooling design; integrated circuit fabrication; packaging; Cooling; Microprocessors; Packaging; Resource management; Runtime; Temperature; Thermal conductivity; Thermal force; Thermal management; Thermal resistance;
fLanguage
English
Journal_Title
Potentials, IEEE
Publisher
ieee
ISSN
0278-6648
Type
jour
DOI
10.1109/MP.2006.1692283
Filename
1692283
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