• DocumentCode
    1198950
  • Title

    A New Technique for the Direct Measurement of Y-Parameters at Microwave Frequencies

  • Author

    Kotzebue, Kenneth L.

  • Volume
    26
  • Issue
    2
  • fYear
    1977
  • fDate
    6/1/1977 12:00:00 AM
  • Firstpage
    119
  • Lastpage
    123
  • Abstract
    A technique has been developed which makes practical the direct measurement of active device two-port y-parameters at microwave frequencies. The instrumentation involved is a simple modification of a conventional s-parameter test set, and the measurement procedure is only slightly more complicated than in a conventional s parameter measurement.
  • Keywords
    Fixtures; Frequency measurement; Instruments; Microwave filters; Microwave frequencies; Microwave measurements; Microwave transistors; Narrowband; Scattering parameters; Testing;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/TIM.1977.4314509
  • Filename
    4314509
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1198950