DocumentCode :
1199049
Title :
Thermal Stability of Junction Transistors and Its Effect on Maximum Power Dissipation
Author :
Lin, H.C.
Volume :
4
Issue :
3
fYear :
1957
fDate :
9/1/1957 12:00:00 AM
Firstpage :
202
Lastpage :
210
Abstract :
When the junction temperature of a transistor increases, the collector current increases, as a result of increases in 1) saturation currents and 2) dc conductances. Thermal instability occurs when junction temperature and collector current increase in regenerative and uncontrollable fashion. The limit depends on factors both within and external to the transistor. The internal factors are the thermal resistance, the current amplification factor, and the base lead resistance. The external factors are ambient temperature, collector voltage, circuit resistances, and the thermal coupling between the transistor and temperature compensation elements, if any. Circuits with greater temperature stability permit a higher maximum power dissipation. The factors are discussed which determine the thermal stability and consequently, the maximum dissipation of transistors. The criteria for stability are derived mathematically and some thermal compensation techniques are treated.
Keywords :
Transistor and solid-state circuits conference papers; Circuit stability; Germanium; Helium; Ice; Power dissipation; Stability criteria; Temperature dependence; Thermal factors; Thermal stability; Voltage;
fLanguage :
English
Journal_Title :
Circuit Theory, IRE Transactions on
Publisher :
ieee
ISSN :
0096-2007
Type :
jour
DOI :
10.1109/TCT.1957.1086375
Filename :
1086375
Link To Document :
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