DocumentCode :
1199170
Title :
A 4-GHz 300-mW 64-bit integer execution ALU with dual supply voltages in 90-nm CMOS
Author :
Mathew, S.K. ; Anders, M.A. ; Bloechel, B. ; Trang Nguyen ; Krishnamurthy, R.K. ; Borkar, S.
Author_Institution :
Circuits Res. Lab., Intel Corp., Hillsboro, OR, USA
Volume :
40
Issue :
1
fYear :
2005
Firstpage :
44
Lastpage :
51
Abstract :
This paper describes a single-cycle 64-bit integer execution ALU fabricated in 90-nm dual-Vt CMOS technology, operating at 4 GHz in the 64-bit mode with a 32-bit mode frequency of 7 GHz (measured at 1.3 V, 25/spl deg/ C). The lower- and upper-order 32-bit domains operate on separate off-chip supply voltages, enabling conditional turn-on/off of the 64-bit ALU mode operation and efficient power-performance optimization. High-speed single-rail dynamic circuit techniques and a sparse-tree semi-dynamic adder architecture enable a dense layout occupying 280 /spl times/ 260 /spl mu/m/sup 2/ while simultaneously achieving: (i) low carry-merge fan-outs and inter-stage wiring complexity; (ii) low active leakage and dynamic power consumption; (iii) high DC noise robustness with maximum low-Vt usage; (iv) single-rail dynamic-compatible ALU write-back bus; (v) simple 2/spl Phi/ 50% duty-cycle timing plan with seamless time-borrowing across phases; (vi) scalable 64-bit ALU performance up to 7 GHz measured at 2.1 V, 25/spl deg/ C; and (vii) scalable 32-bit ALU performance up to 9 GHz measured at 1.68 V, 25/spl deg/ C.
Keywords :
CMOS logic circuits; digital arithmetic; logic design; 1.3 V; 1.68 V; 2.1 V; 25 C; 300 mW; 32 bits; 4 GHz; 64 bits; 64-bit integer execution ALU; 7 GHz; 90 nm; CMOS technology; arithmetic and logic unit; dual supply voltages; dynamic power consumption; high DC noise robustness; high-speed single-rail dynamic circuit techniques; inter-stage wiring complexity; low active leakage; low carry-merge fan-outs; seamless time-borrowing; single-rail dynamic-compatible ALU write-back bus; sparse-tree semi-dynamic adder architecture; Adders; CMOS technology; Circuits; Energy consumption; Frequency measurement; Noise measurement; Phase measurement; Power measurement; Voltage; Wiring; Arithmetic and logic unit (ALU); dual supply voltage design; semi-dynamic design; sparse-tree architecture;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.2004.838019
Filename :
1374989
Link To Document :
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