DocumentCode
1199208
Title
An on-chip active decoupling circuit to suppress crosstalk in deep-submicron CMOS mixed-signal SoCs
Author
Tsukada, Toshiro ; Hashimoto, Yasuyuki ; Sakata, Kohji ; Okada, Hiroyuki ; Ishibashi, Koichiro
Author_Institution
Semicond. Technol. Acad. Res. Center, Yokohama, Japan
Volume
40
Issue
1
fYear
2005
Firstpage
67
Lastpage
79
Abstract
A decoupling circuit using an operational amplifier is proposed to suppress substrate crosstalk in mixed-signal system-on-chip (SoC) devices. It overcomes the parasitic inductance problem of on-chip capacitor decoupling. The effect of the proposed decoupling circuit is not limited by parasitic fine impedance. A 0.13-μm CMOS test chip showed that substrate noise at frequencies from 40 MHz to 1 GHz was incrementally suppressed by sequentially activating three of the proposed circuits in parallel. The power dissipation of each circuit was 3.3 mW at a 1.0-V power supply. The test chip measurement showed that the proposed decoupling reduced crosstalk by 31% at 200 MHz, whereas it was reduced by 4.4% with capacitor decoupling. This 7:1 ratio, or 17 dB, corresponds to the gain of the opamp. Design of the opamp and its feedback loop for active decoupling is simple, making the opamp useful for SoC applications.
Keywords
CMOS integrated circuits; analogue integrated circuits; capacitors; integrated circuit design; integrated circuit noise; mixed analogue-digital integrated circuits; operational amplifiers; system-on-chip; 0.04 to 1 GHz; 0.13 micron; 1.1 V; 17 dB; 3.3 mW; CMOS test chip; analog integrated circuit; crosstalk suppression; deep-submicron CMOS mixed-signal SoC; feedback loop; mixed-signal integrated circuit; on-chip active decoupling circuit; on-chip capacitor decoupling; operational amplifier; parasitic inductance; power dissipation; signal integrity; substrate noise; system on chip; Capacitors; Circuit noise; Circuit testing; Crosstalk; Frequency; Impedance; Inductance; Operational amplifiers; Sequential analysis; System-on-a-chip; Analog and mixed-signal integrated circuit; noise decoupling; signal integrity; submicron CMOS; substrate crosstalk; system on chip;
fLanguage
English
Journal_Title
Solid-State Circuits, IEEE Journal of
Publisher
ieee
ISSN
0018-9200
Type
jour
DOI
10.1109/JSSC.2004.838010
Filename
1374992
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