• DocumentCode
    1199241
  • Title

    An Analysis of Air Breakdown in Electrostatic Recording

  • Author

    Kimura, Masatoshi ; Nakajima, Junzo ; Matsuda, Tadashi

  • Author_Institution
    Peripheral Devices Laboratory, Fujitsu Laboratories, Ltd.
  • Issue
    4
  • fYear
    1984
  • fDate
    7/1/1984 12:00:00 AM
  • Firstpage
    869
  • Lastpage
    872
  • Abstract
    Air breakdown between a very small stylus and a dielectric layer, as is often used in electrostatic recording, has been studied both theoretically and experimentally. In the experiments, styli of 60-pm diameter were placed aginst the dielectric layer of various thicknesses with an air gap of 1-60 pm. Breakdown time lag and breakdown voltage was thereby clarified as follows. 1) The logarithm of the mean statistical time lag is proportional to the logarithm of the repetition rate of breakdown and is inversely proportional to field strength in the air gap. 2) Breakdown voltage in electrostatic recording as a function of the air gap agrees well with the modified Paschen curve obtained in previous experiments using large plane parallel electrodes. These results clarify the limitation of the recording speed, the minimum recording voltage, and optimum air-gap length in electrostatic recording.
  • Keywords
    Air gaps; Breakdown voltage; Current measurement; Dielectric breakdown; Dielectric measurements; Electric breakdown; Electrodes; Electron emission; Electrostatic analysis; Thickness measurement;
  • fLanguage
    English
  • Journal_Title
    Industry Applications, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-9994
  • Type

    jour

  • DOI
    10.1109/TIA.1984.4504499
  • Filename
    4504499