DocumentCode
1199241
Title
An Analysis of Air Breakdown in Electrostatic Recording
Author
Kimura, Masatoshi ; Nakajima, Junzo ; Matsuda, Tadashi
Author_Institution
Peripheral Devices Laboratory, Fujitsu Laboratories, Ltd.
Issue
4
fYear
1984
fDate
7/1/1984 12:00:00 AM
Firstpage
869
Lastpage
872
Abstract
Air breakdown between a very small stylus and a dielectric layer, as is often used in electrostatic recording, has been studied both theoretically and experimentally. In the experiments, styli of 60-pm diameter were placed aginst the dielectric layer of various thicknesses with an air gap of 1-60 pm. Breakdown time lag and breakdown voltage was thereby clarified as follows. 1) The logarithm of the mean statistical time lag is proportional to the logarithm of the repetition rate of breakdown and is inversely proportional to field strength in the air gap. 2) Breakdown voltage in electrostatic recording as a function of the air gap agrees well with the modified Paschen curve obtained in previous experiments using large plane parallel electrodes. These results clarify the limitation of the recording speed, the minimum recording voltage, and optimum air-gap length in electrostatic recording.
Keywords
Air gaps; Breakdown voltage; Current measurement; Dielectric breakdown; Dielectric measurements; Electric breakdown; Electrodes; Electron emission; Electrostatic analysis; Thickness measurement;
fLanguage
English
Journal_Title
Industry Applications, IEEE Transactions on
Publisher
ieee
ISSN
0093-9994
Type
jour
DOI
10.1109/TIA.1984.4504499
Filename
4504499
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