DocumentCode
1199277
Title
Annual amphidromes: a common feature in the ocean?
Author
Chen, Ge ; Quartly, Graham D.
Author_Institution
Key Lab. of Ocean Remote Sensing, Ocean Univ. of China, Qingdao, China
Volume
2
Issue
4
fYear
2005
Firstpage
423
Lastpage
427
Abstract
The scientific term "amphidrome" is usually associated with tides in oceanography. The dozen tidal amphidromes observed in the ocean are critical points that determine the fundamental pattern of the global tidal system. Exploration of recently available satellite data with an unprecedented 1-2 decades duration suggests that an amphidrome is not a tide-only phenomenon in the ocean. Analysis of altimeter-derived sea level anomaly (SLA) data and radiometer-derived sea surface temperature (SST) data allows ten amphidromic points to be clearly identified in annual SLA and SST variations. These amphidromes are located in the tropical areas of the Pacific, Atlantic, and Indian oceans. Their existence implies that the annual cycle (in time) of the atmosphere-ocean system is translated into a rotary variation (in space) for many of the geophysical parameters. It can be concluded that annual amphidromes are common, the knowledge of which is of particular interest, given their annually "constant" nature, for the monitoring and understanding of oceanic, climatic, as well as biological variabilities at seasonal to decadal scales, which strongly affect many aspects of the natural and societal activities on the globe.
Keywords
height measurement; ocean temperature; oceanographic regions; oceanography; annual amphidromes; atmosphere-ocean system; global tidal system; oceanography; rotary variation; satellite data; sea level anomaly; sea surface temperature; tides; Educational programs; Laboratories; Monitoring; Ocean temperature; Radiometry; Remote sensing; Satellite broadcasting; Sea level; Sea surface; Tides; Annual amphidrome; atmosphere–ocean system; sea level anomaly; sea surface temperature;
fLanguage
English
Journal_Title
Geoscience and Remote Sensing Letters, IEEE
Publisher
ieee
ISSN
1545-598X
Type
jour
DOI
10.1109/LGRS.2005.854205
Filename
1522214
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