Title :
Gauge testing of transition jitter measurements for longitudinal thin film magnetic recording
Author :
Huang, M. ; Chu, R. ; Hsia, Y.-T. ; Tran, T.
Author_Institution :
Applic. Eng. Dept., Read-Rite Corp., Milpitas, CA, USA
fDate :
11/1/1994 12:00:00 AM
Abstract :
A gauge test for measuring transition jitter with acceptable accuracy is discussed and presented. The dependence of the transition jitter measurement on head design for a given longitudinal thin film magnetic recording medium is also presented. It is shown that the head type is an important parameter of the measurement of transition jitter in a write process, and the effect due to different head types must be taken into account
Keywords :
jitter; magnetic heads; magnetic recording; magnetic recording noise; magnetic thin films; gauge test; head design; head type; longitudinal thin film magnetic recording; transition jitter measurements; write process; Fluctuations; Frequency; Jitter; Magnetic films; Magnetic heads; Magnetic noise; Magnetic recording; Noise measurement; Power system reliability; Testing;
Journal_Title :
Magnetics, IEEE Transactions on
