Title :
Microstructure of Re-Tm films and anisotropy of domain wall motion
Author :
Pokhil, Taras G. ; Nikolaev, Evgeni N.
Author_Institution :
Inst. of Energy Problems of Chem. Phys., Acad. of Sci., Moscow, Russia
fDate :
11/1/1994 12:00:00 AM
Abstract :
The structure of thin amorphous rare earth-transition metal (Re-Tm) alloy films and domain wall propagation in these films were studied with the help of scanning tunneling microscopy and magnetooptical techniques. The anisotropic displacement of the domain walls arising from the anisotropic film structure was found in the films investigated
Keywords :
amorphous magnetic materials; crystal microstructure; ferromagnetic materials; magnetic domain walls; magnetic domains; magnetic thin films; magneto-optical effects; rare earth alloys; scanning tunnelling microscopy; transition metal alloys; RE-TM films; anisotropic displacement; anisotropic film structure; anisotropy; domain wall motion; domain wall propagation; magnetooptical techniques; microstructure; scanning tunneling microscopy; structure; thin amorphous rare earth-transition metal alloy; Amorphous materials; Anisotropic magnetoresistance; Coercive force; Copper; Magnetic domain walls; Magnetic films; Magnetic force microscopy; Micromagnetics; Microstructure; Protection;
Journal_Title :
Magnetics, IEEE Transactions on
