Microstructure of Re-Tm films and anisotropy of domain wall motion

Author

Pokhil, Taras G. ; Nikolaev, Evgeni N.

Author_Institution

Inst. of Energy Problems of Chem. Phys., Acad. of Sci., Moscow, Russia

Volume

30

Issue

6

fYear

1994

fDate

11/1/1994 12:00:00 AM

Firstpage

4425

Lastpage

4427

Abstract

The structure of thin amorphous rare earth-transition metal (Re-Tm) alloy films and domain wall propagation in these films were studied with the help of scanning tunneling microscopy and magnetooptical techniques. The anisotropic displacement of the domain walls arising from the anisotropic film structure was found in the films investigated

Keywords

amorphous magnetic materials; crystal microstructure; ferromagnetic materials; magnetic domain walls; magnetic domains; magnetic thin films; magneto-optical effects; rare earth alloys; scanning tunnelling microscopy; transition metal alloys; RE-TM films; anisotropic displacement; anisotropic film structure; anisotropy; domain wall motion; domain wall propagation; magnetooptical techniques; microstructure; scanning tunneling microscopy; structure; thin amorphous rare earth-transition metal alloy; Amorphous materials; Anisotropic magnetoresistance; Coercive force; Copper; Magnetic domain walls; Magnetic films; Magnetic force microscopy; Micromagnetics; Microstructure; Protection;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.334108

Filename

334108