Anisotropy and magneto-optical properties of sputtered Co/Ni multilayer thin films

Author

Zhang, Y.B. ; Woollam, J.A. ; Shan, Z.S. ; Shen, J.X. ; Sellmyer, D.J.

Author_Institution

Dept. of Electr. Eng., Nebraska Univ., Lincoln, NE, USA

Volume

30

Issue

6

fYear

1994

fDate

11/1/1994 12:00:00 AM

Firstpage

4440

Lastpage

4442

Abstract

Several series of sputtered Co/Ni multilayer thin films have been investigated. The volume and interface contributions to the magnetic anisotropy were determined from magnetization measurements, and the interface anisotropy, K_i=0.23±0.03 erg/cm², was found to support perpendicular magnetic anisotropy. The anisotropy constant, K, increased with the Au buffer layer thickness, indicating the buffer layer was crucial to the perpendicular magnetic anisotropy. The polar Kerr rotation and coercivity as function of temperature, and room temperature magneto-optical figure of merit are presented in this paper

Keywords

Kerr magneto-optical effect; cobalt; coercive force; ferromagnetic materials; interface magnetism; magnetic anisotropy; magnetic multilayers; magnetisation; nickel; perpendicular magnetic anisotropy; sputtered coatings; Co-Ni; coercivity; interface anisotropy; interface contribution; magnetic anisotropy; magnetization measurements; magneto-optical properties; perpendicular magnetic anisotropy; polar Kerr rotation; room temperature magneto-optical figure of merit; sputtered Co/Ni multilayer thin films; volume contribution; Anisotropic magnetoresistance; Buffer layers; Magnetic anisotropy; Magnetic multilayers; Magnetic properties; Magnetization; Perpendicular magnetic anisotropy; Sputtering; Temperature; Volume measurement;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.334113

Filename

334113