DocumentCode :
1200046
Title :
Long-term testing and applications of high-stress MV EPR cables
Author :
Cinquemani, P.L. ; Kuchta, F.L. ; Hayes, H.L., III ; Chavarria, G.E. ; Lindler, C.E., Jr.
Author_Institution :
Pirelli Power Cables & Syst., Lexington, SC, USA
Volume :
20
Issue :
1
fYear :
2005
Firstpage :
4
Lastpage :
10
Abstract :
High-stress design 35-kV ethylene propylene rubber (EPR)-insulated cables with 1.14-mm (45-mil) wall reduction have been in service for more than ten years. In the mid 1990s, an extensive cable testing program was initiated to demonstrate that high-stress designs up to 4 kV/mm (101.6 V/mil) exhibit a significant electrical and mechanical safety margin to operate on typical utility network systems. Investigations were also undertaken to demonstrate the suitability of accessories for high-stress designs. This paper will present the results of six-year, long-term wet electrical testing conducted to demonstrate that with proper design, the aging performance of standard wall and high-stress design cables provide satisfactory results and suitable performance for the intended application. Additionally, utility field experience is presented on 35- and 15-kV cables operating at high stress. The experience for these 15-kV medium-voltage EPR cable designs employ the highest recommended stress for cables of this class, as well as taking into account the complete system performance.
Keywords :
ethylene-propylene rubber; power cable insulation; power cable testing; ethylene propylene rubber; extensive cable testing program; high-stress MV EPR insulated cables; high-stress design; insulation thickness; long-term testing; utility network system; Aging; Cable insulation; Conductors; Medium voltage; Paramagnetic resonance; Power cables; Rubber; Stress; Temperature; Testing; Aging; cables; ethylene propylene rubber (EPR); high-stress design; insulation thickness; medium voltage; reduced wall;
fLanguage :
English
Journal_Title :
Power Delivery, IEEE Transactions on
Publisher :
ieee
ISSN :
0885-8977
Type :
jour
DOI :
10.1109/TPWRD.2004.837818
Filename :
1375069
Link To Document :
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