• DocumentCode
    1200140
  • Title

    Analysis of 3-D magnetic fields measured using a magnetic force scanning tunneling microscope

  • Author

    Burke, Edward R. ; Gomez, Romel D. ; Mayergoyz, Isaak D.

  • Author_Institution
    Lab. for Phys. Sci., Maryland Univ., College Park, MD, USA
  • Volume
    30
  • Issue
    6
  • fYear
    1994
  • fDate
    11/1/1994 12:00:00 AM
  • Firstpage
    4488
  • Lastpage
    4490
  • Abstract
    The deflections of the probe tip of a magnetic force scanning tunneling microscope are calculated for 3-D magnetic fields. The magnetic fields are calculated for a thin film whose magnetization is uniform through the thickness of the film and can be expressed by Fourier series in the other two dimensions. The deflections are calculated from the energy of interaction between the probe and the 3-D fields. The magnetization is modeled for recorded patterns with arctan transitions. Experimental data can be compared to the theory using the transition lengths as adjustable parameters. The magnetic fields can be determined at all points: along, across, and between the recorded tracks. An example is given for data on guard bands of a recorded track
  • Keywords
    Fourier analysis; magnetic field measurement; magnetic force microscopy; magnetic recording; magnetic thin films; magnetisation; 3-D magnetic fields; Fourier series; arctan transitions; deflections; guard bands; magnetic force scanning tunneling microscope; magnetization; probe tip; recorded track; thin film; transition lengths; Force measurement; Fourier series; Magnetic analysis; Magnetic field measurement; Magnetic films; Magnetic force microscopy; Magnetic forces; Magnetic tunneling; Magnetization; Probes;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.334127
  • Filename
    334127