DocumentCode :
1200140
Title :
Analysis of 3-D magnetic fields measured using a magnetic force scanning tunneling microscope
Author :
Burke, Edward R. ; Gomez, Romel D. ; Mayergoyz, Isaak D.
Author_Institution :
Lab. for Phys. Sci., Maryland Univ., College Park, MD, USA
Volume :
30
Issue :
6
fYear :
1994
fDate :
11/1/1994 12:00:00 AM
Firstpage :
4488
Lastpage :
4490
Abstract :
The deflections of the probe tip of a magnetic force scanning tunneling microscope are calculated for 3-D magnetic fields. The magnetic fields are calculated for a thin film whose magnetization is uniform through the thickness of the film and can be expressed by Fourier series in the other two dimensions. The deflections are calculated from the energy of interaction between the probe and the 3-D fields. The magnetization is modeled for recorded patterns with arctan transitions. Experimental data can be compared to the theory using the transition lengths as adjustable parameters. The magnetic fields can be determined at all points: along, across, and between the recorded tracks. An example is given for data on guard bands of a recorded track
Keywords :
Fourier analysis; magnetic field measurement; magnetic force microscopy; magnetic recording; magnetic thin films; magnetisation; 3-D magnetic fields; Fourier series; arctan transitions; deflections; guard bands; magnetic force scanning tunneling microscope; magnetization; probe tip; recorded track; thin film; transition lengths; Force measurement; Fourier series; Magnetic analysis; Magnetic field measurement; Magnetic films; Magnetic force microscopy; Magnetic forces; Magnetic tunneling; Magnetization; Probes;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/20.334127
Filename :
334127
Link To Document :
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