DocumentCode
1200140
Title
Analysis of 3-D magnetic fields measured using a magnetic force scanning tunneling microscope
Author
Burke, Edward R. ; Gomez, Romel D. ; Mayergoyz, Isaak D.
Author_Institution
Lab. for Phys. Sci., Maryland Univ., College Park, MD, USA
Volume
30
Issue
6
fYear
1994
fDate
11/1/1994 12:00:00 AM
Firstpage
4488
Lastpage
4490
Abstract
The deflections of the probe tip of a magnetic force scanning tunneling microscope are calculated for 3-D magnetic fields. The magnetic fields are calculated for a thin film whose magnetization is uniform through the thickness of the film and can be expressed by Fourier series in the other two dimensions. The deflections are calculated from the energy of interaction between the probe and the 3-D fields. The magnetization is modeled for recorded patterns with arctan transitions. Experimental data can be compared to the theory using the transition lengths as adjustable parameters. The magnetic fields can be determined at all points: along, across, and between the recorded tracks. An example is given for data on guard bands of a recorded track
Keywords
Fourier analysis; magnetic field measurement; magnetic force microscopy; magnetic recording; magnetic thin films; magnetisation; 3-D magnetic fields; Fourier series; arctan transitions; deflections; guard bands; magnetic force scanning tunneling microscope; magnetization; probe tip; recorded track; thin film; transition lengths; Force measurement; Fourier series; Magnetic analysis; Magnetic field measurement; Magnetic films; Magnetic force microscopy; Magnetic forces; Magnetic tunneling; Magnetization; Probes;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/20.334127
Filename
334127
Link To Document