Title :
Embedded-memory test and repair: infrastructure IP for SoC yield
Author :
Zorian, Yervant ; Shoukourian, Samvel
Abstract :
Today´s complex SoCs need sophisticated infrastructure IP, not only to test and diagnose embedded memories but also to repair them and improve fabrication yield. The authors solution integrates memory IP with test and repair IP in a composite infrastructure IP that ensures manufacturing and field repair efficiency and optimizes SoC yield.
Keywords :
built-in self test; integrated circuit testing; integrated memory circuits; system-on-chip; SoC yield; embedded-memory test; fabrication yield; field repair; infrastructure IP; Algorithm design and analysis; Design optimization; Fabrication; Failure analysis; Feedback loop; Logic design; Logic testing; Manufacturing; Qualifications; Random access memory;
Journal_Title :
Design & Test of Computers, IEEE
DOI :
10.1109/MDT.2003.1198687
