• DocumentCode
    1200202
  • Title

    The influence of contact surface microstructure on vacuum arc stability and voltage

  • Author

    Fu, Yan H. ; Smeets, René Peter Paul

  • Author_Institution
    Fac. of Electr. Eng., Eindhoven Univ. of Technol., Netherlands
  • Volume
    17
  • Issue
    5
  • fYear
    1989
  • fDate
    10/1/1989 12:00:00 AM
  • Firstpage
    727
  • Lastpage
    729
  • Abstract
    The authors present the results of DC vacuum arc lifetime and voltage measurements for contacts with different surface microstructures. This was realized by treating the contact surface with emery paper of varying roughness. The contact surface microstructure was found to have a large effect on the DC arc lifetime (several tens of times difference at the most) and arc voltage (30% difference at the most). The mechanism of the surface microstructure effect on DC arc stability was analyzed and is explained preliminarily. The rougher the contact surface is, the longer the arc lifetime and the more stable. The arc itself has a tendency to condition the surface in a way that is unfavorable for a sustained arc lifetime. The crater size for a rough surface is smaller than for a smooth one. The rougher the contact is, the lower the arc voltage (both DC and HF components). The arc erosion has a tendency to increase the arc voltage. It is probable that type I cathode spots (fast motion, small crater size) correspond not only to the surface contamination, but also to the surface roughness
  • Keywords
    arcs (electric); plasma instability; plasma transport processes; plasma-wall interactions; surface structure; HF components; contact surface microstructure; crater size; emery paper; lifetime; rough surface; smooth surface; type I cathode spots; vacuum arc stability; voltage; Cathodes; Hafnium; Microstructure; Rough surfaces; Stability analysis; Surface contamination; Surface roughness; Surface treatment; Vacuum arcs; Voltage measurement;
  • fLanguage
    English
  • Journal_Title
    Plasma Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-3813
  • Type

    jour

  • DOI
    10.1109/27.41192
  • Filename
    41192