DocumentCode :
1200202
Title :
The influence of contact surface microstructure on vacuum arc stability and voltage
Author :
Fu, Yan H. ; Smeets, René Peter Paul
Author_Institution :
Fac. of Electr. Eng., Eindhoven Univ. of Technol., Netherlands
Volume :
17
Issue :
5
fYear :
1989
fDate :
10/1/1989 12:00:00 AM
Firstpage :
727
Lastpage :
729
Abstract :
The authors present the results of DC vacuum arc lifetime and voltage measurements for contacts with different surface microstructures. This was realized by treating the contact surface with emery paper of varying roughness. The contact surface microstructure was found to have a large effect on the DC arc lifetime (several tens of times difference at the most) and arc voltage (30% difference at the most). The mechanism of the surface microstructure effect on DC arc stability was analyzed and is explained preliminarily. The rougher the contact surface is, the longer the arc lifetime and the more stable. The arc itself has a tendency to condition the surface in a way that is unfavorable for a sustained arc lifetime. The crater size for a rough surface is smaller than for a smooth one. The rougher the contact is, the lower the arc voltage (both DC and HF components). The arc erosion has a tendency to increase the arc voltage. It is probable that type I cathode spots (fast motion, small crater size) correspond not only to the surface contamination, but also to the surface roughness
Keywords :
arcs (electric); plasma instability; plasma transport processes; plasma-wall interactions; surface structure; HF components; contact surface microstructure; crater size; emery paper; lifetime; rough surface; smooth surface; type I cathode spots; vacuum arc stability; voltage; Cathodes; Hafnium; Microstructure; Rough surfaces; Stability analysis; Surface contamination; Surface roughness; Surface treatment; Vacuum arcs; Voltage measurement;
fLanguage :
English
Journal_Title :
Plasma Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0093-3813
Type :
jour
DOI :
10.1109/27.41192
Filename :
41192
Link To Document :
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