Title :
Current mode, low-power, on-chip signaling in deep-submicron CMOS technology
Author :
Dhaou, I.B. ; Ismail, Mohammed ; Tenhunen, Hannu
Author_Institution :
R. Inst. of Technol., Kista, Sweden
fDate :
3/1/2003 12:00:00 AM
Abstract :
This paper reports an analogy between on-chip signaling and digital communication over a band-limited channel. This analogy has been used to design a scheme for low-power, on-chip signaling, robustly resistant to power-supply noise. The technique uses multilevel, current-mode signaling as its core. The number of levels is determined by estimating the bandwidth of the wire. A closed-form expression has been presented here describing the bandwidth of a wire modeled as a first-order RLC circuit. An algorithm is presented for computing the levels of the current given target bit rate, bit-error rate, and wire characteristics. Simulation results using HSPICE from Avant! show that the algorithm for computing the wire bandwidth presented here has an average error of less than 10%. Experimental results on a set of benchmark signaling problems implemented in a 0.25-μm 2.5-V CMOS process, show that using four levels of current instead of the standard two levels allows a two-fold reduction in the power and a reduction of 1.4 times the area.
Keywords :
CMOS integrated circuits; VLSI; current-mode circuits; error statistics; integrated circuit design; integrated circuit interconnections; integrated circuit modelling; integrated circuit noise; low-power electronics; system-on-chip; 0.25 micron; 2.5 V; BER; CMOS VLSI circuit; HSPICE; SoC; bandwidth estimation; bit-error rate; closed-form expression; current mode on-chip signaling; deep-submicron CMOS technology; digital CMOS circuitry; digital noise; first-order RLC circuit; interconnect modeling; low-power design; low-power on-chip signaling; multilevel current-mode signaling; power-supply noise robust scheme; wire bandwidth; wire characteristics; Bandwidth; Bit rate; CMOS technology; Circuit noise; Closed-form solution; Digital communication; Noise robustness; RLC circuits; Signal design; Wire;
Journal_Title :
Circuits and Systems I: Fundamental Theory and Applications, IEEE Transactions on
DOI :
10.1109/TCSI.2003.808837