Title :
Analysis of reflection and scattering characteristics at the 60GHz frequency
Author :
Myoung-Won Jung ; Jong Ho Kim ; Young Keun Yoon ; Young Jun Chong
Author_Institution :
Technol. Res. Dept., ETRI, Daejeon, South Korea
Abstract :
This paper presents the analysis result of reflection and scattering characteristics for propagation prediction at the 60GHz frequency. Because the millimeter wave band has very short wavelength within a few millimeter, the scattering characteristic is occurred by the small roughness of the surface of a wall on indoor environment. In addition, because the propagation characteristics appear differently by the surface roughness of mediums, the propagation prediction is very difficult. Therefore, the scattering characteristics according to the surface roughness should be analysed for accurate propagation prediction. To predict the propagation characteristics in the indoor environments, we should have studied changes in the accordance with the rough surface. This paper analyses the reflection and scattering characteristics by the surface roughness of mediums in millimeter wave band, and studies the method for applying to the propagation prediction.
Keywords :
computational electromagnetics; electromagnetic wave reflection; electromagnetic wave scattering; millimetre wave propagation; ray tracing; surface roughness; frequency 60 GHz; indoor wall environment; millimeter wave band; propagation prediction; reflection characteristics analysis; scattering characteristics analysis; surface roughness; Equations; Mathematical model; Reflection; Rough surfaces; Scattering; Surface roughness; Surface waves; millimeter wave; ray-tracing; reflection characteristic; scattering characteristic; surface roughness;
Conference_Titel :
Advanced Communication Technology (ICACT), 2014 16th International Conference on
Conference_Location :
Pyeongchang
Print_ISBN :
978-89-968650-2-5
DOI :
10.1109/ICACT.2014.6778999